Resistive switching: from devices to applications
CIC nanoGUNE Seminars
- Speaker
-
Pablo Stoliar, nanoGUNE
- When
-
2014/12/10
12:00 - Place
- nanoGUNE seminar room, Tolosa Hiribidea 76, Donostia - San Sebastian
- Add to calendar
- iCal
Resistive switching (RS) refers to the reversible change of the resistance of
a nanometer sized media by the application of electrical pulses. Many physical
processes matching this concept have been identified, ranging from the
controlled re-localization of ion vacancies in oxide matrices to the electric-
field-induced metal-to-insulator transition in Mott insulators.
Devices based on this phenomena are making huge impact in two applicative
fields, nonvolatile electronic memory devices and neuromorphic systems.
Indeed, resistive random-access memories (ReRAM) is becoming one of the
promising candidates to substitute for the standard memory technologies in the
near future. Regarding neuromorphic engineering, RS devices might be a very
efficient building block when it comes to the implementation of spiking neural
networks.
In this talk, we will review the basic concepts behind RS and introduce our RS
devices. Two of our applicative research lines will be presented as well.
References:
Nonvolatile Multilevel Resistive Switching Memory Cell: A Transition Metal
Oxide-Based Circuit
Stoliar P, et al. IEEE Transactions on Circuits and Systems II 61, 21 (2014)
Universal electric-field-driven resistive transition in narrow gap Mott
insulators
Stoliar P, et al. Adv. Mater. 25, 3222 (2013)
Resistive switching dependence on atomic layer deposition parameters in HfO
2-based memory devices
Zazpe R, et al. J. Mater. Chem. C 2, 3204 (2014)
Control the resistive switching in AM4Q8 narrow gap Mott insulators: a first
step towards neuromorphic applications
Tranchant J, et al. Phys. Status Solidi A. (2014)
Building memristive and radiation hardness TiO2-based junctions.
Ghenzi N, et al. Thin Solid Films 550, 683 (2014)
Non-Hebbian Learning Implementation in Light-Controlled Resistive Memory
Devices
Ungureanu M, et al. PLoS ONE 7, e52042 (2013)