Scanning Microwave Microscopy and Electrostatic Force Microscopy for nanoscale characterzation of materials at khz and GHz frequency

CIC nanoGUNE Seminars

Speaker: Dr. Georg Gramse, JKU Linz, Austria
When: 2015/09/07
13:00
Place: nanoGUNE seminar room, Tolosa Hiribidea 76, Donostia - San Sebastian
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Scanning Microwave Microscopy and Electrostatic Force Microscopy for nanoscale characterzation of materials at khz and GHz frequency

The presentation will give a short introduction on both electrical SPM techniques EFM and SMM and how they can be used in the field of Material Science and Biophysics. A short overview on results will be given for measurements on materials like oxides, semi-conductors, 2d materials and for biological samples like biomembranes and entire bacteria. **Host** : Pablo Stoliar