Large Scale Simulations of Phase Change Materials for Data Storage
DIPC Seminars
- Speaker
-
Marco Bernasconi (Department of Materials Science, University of Milano-Bicocca, Italy)
- When
-
2016/02/05
12:00 - Place
- Donostia International Physics Center
- Add to calendar
- iCal
**Large Scale Simulations of Phase Change Materials** ** for Data Storage**
** **
**Marco Bernasconi**
** **
Department of Materials Science
University of Milano-Bicocca, Milano, Italy
Chalcogenide compounds such as GeTe and GeSbTe alloys are attracting an
increasing interest for their application in Phase Change Memories (PCM) [1].
This novel type of electronic non-volatile memory rests on a fast (2-100 ns)
and reversible transformation between the crystalline and amorphous phase of a
chalcogenide film due to Joule heating. The two phases corresponding to the
two states of the memory can be discriminated because of their large
difference in electronic conductivity.
PCMs are emerging as a leading contender for the realization of the so-called
storage class memories that are sought to fill the performance gap between
volatile DRAM and non-volatile Flash memories [2]. Storage class memories are
believed to usher in seminal changes in the memory and storage hierarchy for
all computing platforms ranging up to high-performance computing.
In the last few years, atomistic simulations based on density functional
theory (DFT) have provided useful insights on the properties of chalcogenide
alloys of interest for PCMs [3]. Still, large simulation cells and long
simulation times beyond the reach of fully DFT simulations are needed to
address several key issues of relevance for PCM performances. To overcome
these limitations, we have developed an interatomic potential for the
prototypical phase change compound GeTe by fitting a huge DFT database with a
neural network (NN) scheme. Large scale (104 atoms) NN simulations allowed us
to get insights on the thermal transport and on microscopic origin of the high
crystallization speed of these materials [4].
In this talk, I will present the results of NN simulations on the kinetics of
homogeneous and heterogeneous crystallization of GeTe and on the structural
relaxations leading to the aging of the amorphous phase and to a drift in the
electronic resistance which is a particularly critical issue for PCM
operation.
[1] M. Wuttig and N. Yamada, Nature Mater. 6, 824 (2007).
[2] G. W. Burr et al., IBM J. Res. Dev. 52, 449 (2008).
[3] S. Caravati et al, Appl. Phys. Lett. 91, 171906 (2007); Lencer et al.,
Adv. Mat. 23, 2030 (2011).
[4] G. C. Sosso et al. J. Phys. Chem. Lett. 4, 4241 (2013); J. Phys. Chem. C
119, 6428 (2015);
J. Phys. Chem. B 118, 13621 (2014); Phys. Rev. B 86,
104301 (2012); ibidem 85, 174103 (2012).