Richard Arinero

Université Montpellier 2, France

Short-stay Visiting Researcher

Ikerketa gaia

Dielectric spectroscopy at nano-scale by atomic force microscopy (AFM) techniques.

Azken Check-in - Check-out datak

2011/06/21 - 2011/06/24

Aurreko egonaldiak

7 (2008(e)an hasita)